journal6 ›› 2006, Vol. 27 ›› Issue (5): 82-84.

• 物理与电子 • 上一篇    下一篇

显微镜法中物体高度对折射率的影响

  

  1. (吉首大学物理科学与信息工程学院,湖南 吉首 416000)
  • 出版日期:2006-09-25 发布日期:2012-06-29
  • 作者简介:廖立新(1970-),湖南龙山人,吉首大学物理科学与信息工程学院教师,主要从事实验教学与研究.
  • 基金资助:

    湖南省教育厅科学研究项目(05B014)

Selection of Height of the Object in the Experiment Measuring the Index of Refraction with the Macroscopic Method

  1. (College of Physics and Information Engineering,Jishou University,Jishou  416000,Hunan China)
  • Online:2006-09-25 Published:2012-06-29

摘要:分析了用显微镜测物体折射率的实验中物体的高度与测量精度的关系,讨论了物体的高度对物像清晰度和测量误差的影响.结果表明待测物体的高度满足H≈nh时,测量误差最小,物像最清晰.

关键词: 高度, 最大值:折射率, 数据, 误差

Abstract: The relation between the height of the measured object and measuring precision is analyzed in the experiment measuring the index of refraction with macroscopic method;and it is also demonstrated how to select the height of the measured object to ensure clear image and least measuring error.It is concluded that the height of the object H should satisfy:H≤nh;on the other hand,the closer H is to nh,the higher the measuring precision is.In a word,the height of the object should be slightly smaller than nh.

Key words: height, maximum value, index of refraction, data, error

公众号 电子书橱 超星期刊 手机浏览 在线QQ