journal6 ›› 2012, Vol. 33 ›› Issue (1): 41-45.DOI: 10.3969/j.issn.1007-2985.2012.01.011

• Physics and electronics • Previous Articles     Next Articles

The Modified of the X-Ray Diffraction Intensity Formula


  1. (1.Institute of Physics,Jilin Normal University,Siping 136000,Jilin China;2.Institute of High Energy Physics,Chinese Academy of Sciences,Beijing100049)
  • Online:2012-01-25 Published:2012-04-26

Abstract: The X-ray diffraction technology has been widely applied in phase identification,the determination of lattice parameters and the testing of the microstress.In order to precisely determine the physical parameters,the calculation of the X-ray diffraction intensity is very important.At present,comparedg with the experimental data,the theoretical results of the X-ray diffraction intensity formula have a large deviation.In this paper,the X-ray diffraction intensity formula has been modified reasonably and the improved results of the theoretical are in good accordance with the experimental data.

Key words: the X-ray diffraction, crystal structure, revise

WeChat e-book chaoxing Mobile QQ