journal6 ›› 2000, Vol. 21 ›› Issue (4): 36-40.

• Physics and electronics • Previous Articles     Next Articles

Standarding and Data Acquisition on Dynamic I/O Characteristic Curve of Silicon Accelerometer


  1. ( 1. Institute of Microelectronic,Tsinghua University, 100084, Beijing China;2. Institute of Sensor, Jishou University, Jishou 416000, Hunan China)
  • Online:2000-12-15 Published:2013-01-05

Abstract: In this paper, we have introduced a measuring and controlling system of vibrometer;standardizing technology on gvalue of vibrometer and introduced especially technology to reduce the standardizing errors. On the basis, we have introduced communication and programming technique in this data acquisition with model HP34401A digital multimeter and computer. By utilizing this system , we standardize and collect many I/O characteristic curve for instrument grade piezoresistive silicon accelerometer jointly developed by ourselves. We have obtained satis fyingly reliable results.

Key words: measuring and controlling system of vibrometer, standardizing technology on dynamic I/O characteristic curve, data acquisition technique

WeChat e-book chaoxing Mobile QQ