journal6 ›› 2012, Vol. 33 ›› Issue (1): 41-45.DOI: 10.3969/j.issn.1007-2985.2012.01.011

• 物理与电子 • 上一篇    下一篇

X射线衍射强度公式的修正

  

  1. (1.吉林师范大学物理学院,吉林 四平 136000;2.中国科学院高能物理所,北京 100049)
  • 出版日期:2012-01-25 发布日期:2012-04-26
  • 作者简介:巴诺(1981-),女,吉林长春人,吉林师范大学物理学院讲师,主要从事理论物理研究.
  • 基金资助:

    吉林省教育厅科学研究资助项目(2006016)

The Modified of the X-Ray Diffraction Intensity Formula

  1. (1.Institute of Physics,Jilin Normal University,Siping 136000,Jilin China;2.Institute of High Energy Physics,Chinese Academy of Sciences,Beijing100049)
  • Online:2012-01-25 Published:2012-04-26

摘要:X射线衍射技术在物相分析、点阵参数测量以及微应力的测定等方面被广泛应用,为了更精确地确定物理参数,X射线衍射强度的精确计算是十分重要的.目前单晶X射线衍射的强度公式的理论计算结果与实验数据有较大偏差.对衍射强度公式进行合理修正,使计算结果得到较大改善,并与实验测量的数据符合得更好.

关键词: X射线衍射, 晶体结构, 修正

Abstract: The X-ray diffraction technology has been widely applied in phase identification,the determination of lattice parameters and the testing of the microstress.In order to precisely determine the physical parameters,the calculation of the X-ray diffraction intensity is very important.At present,comparedg with the experimental data,the theoretical results of the X-ray diffraction intensity formula have a large deviation.In this paper,the X-ray diffraction intensity formula has been modified reasonably and the improved results of the theoretical are in good accordance with the experimental data.

Key words: the X-ray diffraction, crystal structure, revise

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